NFA100 Vth software for Intel/Micron NAND allows accurate measurement of the voltage distributions for compatible Intel/Micron NANDs

• Including measurement of relative distances between default read levels
• The software will work on any Intel/Micron NAND supporting Randomizer

Disablement and Read Offset operations (via the usual Set Features commands)

• After a Vth Distribution test is successfully completed, the randomizer will be enabled and the applicable read offsets will be set to zero
• If a test is aborted or terminates before successful completion, the randomizer may be disabled and read offsets not zero. In this case, you will need to use    Get/Set feature commands (for instance through the standard NFA100 GUI software) to return these feature addresses to desired values